The VIAVI ONT CFP2 test solution helps address all second-generation 100 G challenges. Its unique applications probe deeper into the physical layer and, combined with powerful accessories such as the CFP2 electrical adapter, can accelerate troubleshooting, thus bringing products to market faster and more reliably.

 Address Second-Generation 100 G Challenges to Bring Products to Market Faster

 The CFP2, based on 25/28 G input/output (I/O) technology, is critical for cost-effectively driving mass deployment of 100 G. While the first-generation 100 G CFP was based on 10 G I/O, CFP2 density and price drivers require deploying novel 25/28 G technology, challenging everyone from IC and optical module vendors through equipment manufacturers. Signal integrity and physical layer considerations add more complexity.

Target Applications

IC development and validation test: a powerful, flexible electrical interface (via an active CFP2 electrical adapter) with wide ranging physical-layer applications and comprehensive troubleshooting tools for signal integrity, PCS, Ethernet, and OTN traffic using real-world traffic rather than limited, unframed PRBS signals to validate performance.

Transponder test: native support for CFP2 modules with MDIO debugging and single-button CFP2 test applications help develop and validate CFP2 modules to challenging standard requirements like dynamic skew.

 System development: JDSU CFP2 test solution covers the physical layer through to PCS, Ethernet/IP, and OTN, making it the ideal tool for hardware and software developers to proof their designs. In system verification labs, it leaves no area uncovered, and with its leading-edge remote automation support it is helping NEMs bring new 100 G systems to market quickly and with greater confidence.

Manufacturing test: A less-expensive version is available that has been is optimized specifically for manufacturing and syste

Key Benefits

Provides comprehensive tools for troubleshooting signal integrity, unframed PCS, Ethernet, and OTN traffic using real-world traffic to validate performance rather than limited, unframed PRBS signals

Helps to quickly identify root causes for bit errors with advanced error-analysis applications

Enables IC testing and other components that require framed test signals

Helps to develop and validate second-generation 100 G modules including CFP2, CFP4, and QSFP28 to challenging requirements including dynamic skew

One-box solution completely validates CFP2 optics including control, power, data physical layer, and MDIO

Provides MLG 1.0 support for ASIC, optical module, and line card validation

New dual-port version simultaneously generates Ethernet/OTN traffic on both ports and offers bidirectional OTN through mode, OTN/Ethernet add/drop mode, and IEEE 1588v2 bidirectional monitor mode

Cuts costs on new 100 G system development with one configurable test solution for the physical layer through to PCS, Ethernet, and OTN

Unique solution for testing PTP 1588v2 at 40 GE and 100 GE

m verification testing (SVT) applications (ONT-602) with comprehensive automation support.